Powder X-Ray Diffraction
Our powder X-ray diffraction services deliver precise, reproducible structural characterization to support your research, quality control, and product development needs. Using advanced PXRD techniques we accurately identify crystalline phases, determine unit cell parameters, and analyze material structure across a wide range of samples. Whether you're confirming polymorphic form, assessing crystallinity, ensuring regulatory compliance, or troubleshooting formulation issues, our expert team provides reliable data and clear insights to help you make informed decisions with confidence.
Instrument
Proto AXRD Theta-Theta (Long Fine focus, Co-anode, power rating: 1800 W, hybrid photon counting detector)
Method
Rietveld refinement per IUCr Commission on Powder Diffraction guidelines (ASTM C1365 is the closest analog but is cement-specific)
Detection Limits
~1–3 wt% for routine quantification; 0.5–1 wt% achievable for strong scatterers like Cu, CuO, Cuâ‚‚O with optimized count times
Deliverables
Diffractogram, phase ID list with ICDD PDF card numbers, Rietveld-refined wt% for each crystalline phase, goodness-of-fit metrics (Rwp, χ²)